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IEEE Std 1505.1-2008 IEEE Trial-Use Standard for the Common Test Interface

标准名称：IEEE Std 1505.1-2008 IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier

标准格式：PDF

标准大小：1.63 MB

标准状态：现行

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更新日期：2011年10月26日

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IEEE Std 1505.1-2008 IEEE Trial-Use Standard for the Common Test Interface Pin
Map Configuration for High-Density, Single-Tier Electronics Test Requirements

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IEEE Std 1505.1-2008 IEEE Trial-Use Standard for the Common Test Interface

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